Equipment information

B & K Manufacturing Company 501A Analyzer
Manufacturer:
Model:
501A
Date:
1972
Category:
Group:
Description:
Semiconductor Curve Tracer

Information

The semiconductor curve tracer displays a family of dynamic characteristic curves for transistors, FET's, diodes, Zener diodes, triacs, tunnel diodes and all other semiconductor devices on the screen of an Oscilloscope. Most authorities agree that a dynamic curve tracer is the best instrument for testing semiconductors, since it simulates actual operating conditions of changing voltage and current. Some of the characterististics which may be measured are gain (beta), leakage, breakdown voltage, output admittance, linearity, effects of capacitance and effects of temperature. When first introduced, semiconductor curve tracers were primarily employed in engineering laboratories to select transistors with specific characteristics for design applications. Later the instruments became widely used for sorting, inspecting and testing semiconductors in production assembly and by technicians for troubleshooting. The latest application has been the discovery that curve tracers can be used for troubleshooting without removing the semi- conductor from the circuit. In addition, a semiconductor curve tracer offers several other servicing advantages. By matching characteristics, balanced and/or complementary pairs may be selected. Matching also allows sorting and selection of transistors for substitution, resulting in an inventory reduction of replacement parts. An Oscilloscope must be used in conjunction with the curve tracer for the display. Almost any 3-inch or larger general purpose Oscilloscope is satisfactory as long as it has external horizontal facilities, and is DC coupled. The B & K Models 1440, 1460 and 1465 Oscilloscopes are ideal companions for the Model 501A Curve Tracer. A graticule overlay for the Oscilloscope screen and built-in calibration signals from the curve tracer makes the unit complete. The special 3-tip Probe supplied with the unit simplifies in-circuit testing by contacting base, collector and emitter simultaneously with a single Probe. This is very convenient for testing transistors mounted on circuit boards.

show more

Service and User Manual
Manual Type:
Service and User Manual
Pages:
40
Size:
16.65 Mbytes (17461254 Bytes)
Language:
english
Revision:
Manual-ID:
Date:
1972 01 01
Quality:
Scanned document, all readable.
Upload date:
2018 08 06
MD5:
4d7e82e8c642667d82eb86eea1e0e7b3
Downloads:
584

Information

INTRODUCTION ... 1 SPECIFICATIONS ... I CONTROLS AND OPERATOR'S FACILITIES ... 3 OPERATING INSTRUCTIONS ... 4 CURVE TRACER SET-UP ... 5 Oscilloscope SET-UP AND CALIBRATION ... 5 Vertical Calibration ... 5 Horizontal Calibration ... 6 Low Voltage Horizontal Calibration ... 6 High Voltage Horizontal Calibration ... 7 Oscilloscope Connections to Curve Tracer ... 8 SEMICONDUCTOR DEVICE CONNECTIONS TO CURVE TRACER ... 8 Plug-In Transistors ... 8 Non Plug-In Transistors ... 8 In-Circuit Probe ... 9 Diodes ... 9 TYPICAL SEMICONDUCTR TESTS ... 9 Familiarization with the Curve Tracer ... 9 Transistor Testing Procedure ... 9 Effects of Curve Tracer Controls ... II Sorting and Matching Transistors ... 12 In-Circuit Transistor Testing ... 13 CURVE TRACER APPLICATIONS ... 14 Testing Bipolar Transistors ... 14 NPN vs. PNP Transistors ... 14 CURRENT GAIN MEASUREMENT ... 14 DC Current Gain (DC beta) ... 15 AC Current Gain (AC beta) ... 15 Summary of Transistor Current Gain ... 16 Current Gain Linearity vs. Distortion ... 16 BREAKDOWN VOLTAGE MEASUREMENT ... 18 LEAKAGE MEASUREMENT (I(.K„) ... 19 SATURATION VOLTAGE [Vr„(,iir)] ... 19 OUTPUT ADMITTANCE (hj ... 20 EFFECTS OF TEMPERATURE ... 20 TESTING FET'S ... 21 Transconductance (Gain) Measurement ... 22 Pinch-Off (Vp) Voltage Measurement ... 23 TESTING SIGNAL AND RECTIFIER DIODES ... 24 Testing Zener Diodes ... 25 TESTING UNIJUNCTION TRANSISTORS ... 26 TESTING SILICON CONTROLLED RECTIFIERS ... 27 TESTING TRIACS ... TESTING TUNNEL DIODES ... TESTING OTHER SEMICONDUCTOR DEVICES Diacs ... Integrated Circuits ... MAINTENANCE AND CALIBRATION ... Calibration Procedure ... Alternate Method using an Oscilloscope . Curve Display Modification ... Troubleshooting ... CIRCUIT DESCRIPTION ... ... 30 ... 30 ... 30 ... 30 ... 30 ... 30 ... 30 ... 31 ... 32

show more

Service and User Manual
Manual Type:
Service and User Manual
Pages:
40
Size:
16.65 Mbytes (17461166 Bytes)
Language:
english
Revision:
Manual-ID:
Date:
1972 01 01
Quality:
Scanned document, all readable.
Upload date:
2018 08 05
MD5:
ee8908b218831db9a3cf07e8862b52e6
Downloads:
578

Information

INTRODUCTION ... 1 SPECIFICATIONS ... 1 CONTROLS AND OPERATOR'S FACILITIES ... 3 OPERATING INSTRUCTIONS ... 4 CURVE TRACER SET-UP ... 5 Oscilloscope SET-UP AND CALIBRATION ... 5 Vertical Calibration ... 5 Horizontal Calibration ... 6 Low Voltage Horizontal Calibration ... 6 High Voltage Horizontal Calibration ... 7 Oscilloscope Connections to Curve Tracer ... 8 SEMICONDUCTOR DEVICE CONNECTIONS TO CURVE TRACER ... 8 Plug-In Transistors ... 8 Non Plug-In Transistors ... 8 In-Circuit Probe ... 9 Diodes ... 9 TYPICAL SEMICONDUCTR TESTS ... 9 Familiarization with the Curve Tracer ... 9 Transistor Testing Procedure ... 9 Effects of Curve Tracer Controls ... 11 Sorting and Matching Transistors ... 12 In-Circuit Transistor Testing ... 13 CURVE TRACER APPLICATIONS ... 14 Testing Bipolar Transistors ... 14 NPN vs. PNP Transistors ... 14 CURRENT GAIN MEASUREMENT ... 14 DC Current Gain (DC beta) ... 15 AC Current Gain (AC beta) ... 15 Summary of Transistor Current Gain ... 16 Current Gain Linearity vs. Distortion ... 16 BREAKDOWN VOLTAGE MEASUREMENT ... 18 LEAKAGE MEASUREMENT ... 19 SATURATION VOLTAGE ... 19 OUTPUT ADMITTANCE ... 20 EFFECTS OF TEMPERATURE ... 20 TESTING FET'S ... 21 Transconductance (Gain) Measurement ... 22 Pinch-Off (Vp) Voltage Measurement ... 23 TESTING SIGNAL AND RECTIFIER DIODES ... 24 Testing Zener Diodes ... 25 TESTING UNIJUNCTION TRANSISTORS ... 26 TESTING SILICON CONTROLLED RECTIFIERS ... 27 TESTING TRIACS ... 28 TESTING TUNNEL DIODES ... 29 TESTING OTHER SEMICONDUCTOR DEVICES ... 30 Diacs ... Integrated Circuits ... MAINTENANCE AND CALIBRATION ... Calibration Procedure ... Alternate Method using an Oscilloscope Curve Display Modification ... Troubleshooting ... CIRCUIT DESCRIPTION ...

show more