Tektronix TDS8200 Osciloscopio
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Digital Sampling Oscilloscope
Series instruments are high-speed, precision sampling systems that find use in validation and
conformance testing and impedance verification for:
High-performance semiconductor/computer applications, such as semiconductor testing, TDR characterization of
circuit boards, IC packages and cables, and high-speed serial digital data communications.
High-performance communications applications, such as design evaluation and manufacturing test of datacom and
telecom components, transceiver subassemblies, and transmission systems.
The instruments include a user Interface
that runs on the Microsoft Windows 2000 operating system as a windowed
application. You operate the instrument using front-panel controls with the mouse and keyboard or with the touch screen.
Industry-leading waveform acquisition and measurement rate, with Sample, Envelope, and Average acquisition modes.
Support for up to six sampling modules (two large and four small modules). Up to eight inputs can be active at a time.
Supports integrated optical and/or electrical signal pick-off and clock recovery, enabling accurate triggering on optical
and/or electrical communication-signals.
Support for optical modules with several integrated, selectable reference receivers, which eliminates the need for a
multitude of add-on reference receivers.
Full programmability, with an extensive GPIB-command set and a message-based Interface
True differential TDR, with fast step (15 psec reflected risetime) when used with a TDR-capable 80E10 sampling module.
Industry-leading trigger bandwidth (12+ GHz) when using the built-in-prescaler.
Support of both telecom (SONET and SDH) and datacom (Fibre Channel, Infiniband, and Gigabit Ethernet) optical
Powerful built-in measurement capability, including histograms, mask testing, and automatic measurements.
Automatic measurements operate on Pulses, RZ eye patterns, and NRZ eye patterns.
DC to 65 GHz optical bandwidth; DC to 70+ GHz electrical bandwidth, with up to 12.5 GHz triggering.
NOTE. Bandwidth is determined by the specific modules that are installed.
Low jitter (200 fs typical) in phase reference modes with the 82A04 Phase Reference module.
FrameScan acquisition for isolating data-dependent failures during conformance/performance testing and for examining very low-level repetitive signals.
Jitter analysis with the 80SJNB Advanced Jitter, Noise and BER Analysis Software
for the TDS/CSA8000
Sampling Oscilloscopes application (requires Software
key). Refer to the 8000 Series Product Software
CD-ROM booklet for free trial information and Software
Pattern (frame) triggering with the 80A06 PatternSync Trigger module.
HImproved acquisition throughput and timing accuracy using the PatternSync Trigger module in conjunction with FrameScan.
HSupport for optical conformance testing of SONET/SDH signals (including the various forward error correction rates for these telecom rates) from 155 Mbps to 43 Gb/s, FibreChannel signals, and 1, 2, and 10 Gigabit Ethernet signals as well as 2.5 Gb/s Infiniband signals.
NOTE. Support for conformance testing rates is determined by the specific modules that are installed.
High precision time base with two modes of operation, locked and short-term jitter-optimized.
Negligible long-term jitter degradation (<0.1 ppm), which substantially improves the ability to view signals that are
delayed far from the trigger point without distortion.
Improved short-term and long-term trigger jitter.
A gated trigger option (Option GT) that lets you disable or enable (gate) triggering based on a TTL signal you connect
to the instrument rear panel. This Option allows you to use recirculating buffers as part of your test setup to simulate
the effects of very long optical links that are typical of undersea cables and long terrestrial links.
Analysis and connectivity tools enable the instrument to be controlled from a variety of local and remote environments
and to share data with other commercially available analysis programs.
Predefined, built-in masks in addition to the user-defined masks.
A large 10-inch color display that supports color grading of waveform data to show sample density.
An intuitive UI (User Interface), with built-in online help displayable on screen.
Tipo de Manual
Manual del usuario
3.41 Mbytes (3573616 Bytes)
Documento electrónico, sin análisis, muy bien legible.
Fecha de subida:
29 septiembre 2019
Quick Start User Manual
General Safety Summary ... .
Preface ... .
Documentation ... .
Conventions Used in this Manual ... .
Key Features ... .
Install Your Instrument ... .
Standard Accessories ... .
Operating Considerations ... .
Mechanical ... .
Environmental ... .
Power Supply ... .
Input Connectors ... .
Certifications ... .
Installing Modules ... .
Powering the Instrument On and Off ... .
Creating an Emergency Startup Disk ... .
Adding a Second Monitor ... .
Changing the Windows Language ... .
Getting Acquainted with Your Instrument ... .
Front Panel ... .
Rear Panel ... .
Interface ... .
Control Panel ... .
Display - Single Graticule View ... .
Display - Multiple Views ... .
Accessing Online Help ... .
Inspect Your Instrument ... .
Verify Internal Diagnostics Pass ... .
Optimizing Measurement Accuracy ... .
Signal Path Compensation ... .
Perform Dark-Level and User Wavelength Gain Compensations ... .
Acquisition ... .
Setting Up Signal Input ... .
Using Autoset ... .
Using Default Setup ... .
Accessing the Setup Dialog Boxes ... .
Changing the Acquisition Mode ... .
Setting the Display Style ... .
Triggers ... .
Triggering Concepts ... .
Trigger Event ... .
Trigger Type ... .
Trigger Modes ... .
Trigger Sources ... .
Trigger Source Connectors ... .
Gated Trigger Connector (Option GT Equipped) ... .
Enhanced Triggering ... .
Trigger Holdoff ... .
Setting Trigger Controls ... .
Setting Pattern Sync Controls ... .
Checking Trigger Status ... .
Analyzing Waveforms ... .
Taking Automatic Measurements ... .
Turning Off Automatic Measurements ... .
Cursor Measurements ... .
Math Waveforms ... .
Waveform Databases ... .
Display a Communication Signal ... .
Display and Analyze Communication Signals Using Mask Testing ... .
FrameScan ... .
To Use TDR ... .
Phase Reference ... .
Histograms ... .
Document Your Results ... .
Using the 80A05 Electrical Clock Recovery Module Examples ... .
Clock Recovery / Trigger on Recovered Clock ... .
Clock Recovery / Trigger for Optical Signal, with the 80C12 Optical Module ... .
Differential Clock Recovery and Acquisition ... .
Probing with Low-impedance Probes ... .
Probing with Differential to Single-ended Probes ... .
Vertical Gain Adjustment ... .
Skew and Deskewing ... .
Sources of Skew ... .
Minimizing Skew ... .
Measuring Skew ... .
Methods to Deskew Your Signals ... .
Methods to Adjust Out Skew ... .
Differential TDR Deskew Method ... .
Configuration/Setup Considerations ... .
Performing Acquisition Deskew ... .
Performing TDR Step Deskew ... .
Cleaning the Instrument ... .
Exterior Cleaning ... .
Flat Panel Display Cleaning ... .
Optical Connector Cleaning ... .
Index ... .