Оборудование информация

A.B.I. Electronics Rammaster Compact Другой
Производитель:
A.B.I. Electronics
Модель: Rammaster Compact
Дата: 1993
Категория: Измерительная техника
Группа: Другой
Описание: High speed Memory Tester
Информация:
                                    The basic function of the RamMaster Compact is to perform
a full speed functional test on DRAMs, SRAMs, SIMMs and
SIPs using a variety of test algorithms to ensure reliable
and rapid results. The test is performed by reconfigurable
HARDWARE, allowing most memories to be tested at their
theoretical full speed. Any malfunctioning memory cell
results in a FAIL indication, and in the case of SIMM and
SIP modules the faulty bit(s) is/are identified on the
integral LCD display so that the module can be repaired.
Additional facilities are also provided, amongst them
test loops that can be used for goods inwards inspection
or detecting intermittent faults. The supply voltage
to the IC under test can be varied by ±5% during the
test to simulate actual circuit conditions. Since the
RamMaster Compact contains an extensive memory IC library,
it is not necessary to programme the unit other than
to select the IC part type. The unit is equipped with
sockets covering the majority of Dual in Line (DIL),
SIMM and SIP packages, and a range of adaptors are
available for SOJ and ZIP packages and also for 72 pin
PS/2 type SIMM modules. The RamMaster is capable of being
upgraded and is designed to test the components of
tomorrow.

Эти руководства доступны для вышеуказанного оборудования:

A.B.I. Electronics -- Rammaster Compact -- Руководство пользователя
Имя файла: A.B.I.Electronics-4263-Manual-Page-1-Picture
Ручной тип: Руководство пользователя
Страниц: 14
Размер: 5.34 Mbytes (5603237 Bytes)
Язык: английский
Редакция:
Руководство ID/номер:
Дата: 1993
Качество: Отсканированы документу, все читается.
Дата загрузки:
MD5: c32fb4becb3a75d2e6134f42e948fa90
Загрузки: 254 начиная с 16 Март 2013
Информация:
DC INPUT	1

BATTERY ELIMINATOR	1

SWITCHING ON	2

USING THE MENUS	2

SELECTING THE MEMORY TO TEST	3

SELECTING THE TEST MODE	4

SELECTING THE TEST SPEED	4

INSERTING THE IC OR MODULE	5

TESTING THE IC OR MODULE	7

USING THE 72 PIN (PS2) SIMM ADAPTOR	8

USING THE ZIP ADAPTOR	9

USING THE SOJ ADAPTOR	9

USING CONFIG MODE	9

TEST ALGORITHM	9

SUMMARY OF TEST ALGORITHMS	11

TEST VCC VOLTAGE	11

AUTO POWER OFF	11

ERROR COUNT	11

SELF TEST MODE	12

SPECIFICATION	
A.B.I.Electronics-4263-Manual-Page-1-Picture
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