Informacje o sprzęcie

Huntron Instruments Tracker 2000 Test Set
Producent:
Huntron Instruments
Modelu: Tracker 2000
Data: 1997
Kategorii: Przyrządy pomiarowe
Grupa: Test Set
Opis:
Informacje:
                                    The Huntron Tracker 2000 is a versatile troubleshooting tool
having the following features:

•	Multiple test signal frequencies (50 or 60 Hz, 200 or 400
Hz, 2000 Hz).

•	Four impedance ranges (low, medium 1, medium 2, high).

•	Automatic range scanning.

•	Range control: High Lockout

•	Rate of channel alternation and/or range scanning is
adjustable.

•	Dual polarity pulse generator for dynamic testing of three
terminal devices.

•	TFT) indicators for all functions.

•	Dual channel capability for easy comparison.

•	Large CRT display with easy to operate controls.

Te Podręczniki są dostępne dla powyższego urządzenia:

Typ instrukcji: Serwis i User Manual Huntron-9023-Manual-Page-1-Picture
Stron: 261
Rozmiar: 12.28 Mbytes (12881223 Bytes)
Język: Angielski
Zmiana:
Podręcznik numer: 21-1229
Data: 01 grudzień 1997
Jakość: Skanowany dokument, wszystko czytelne.
Data wysłania:
MD5: 44269b0e3a1abb83840a149acaec3db0
Pliki do pobrania: 68 od 14 maj 2017
Informacje:
 1 INTRODUCTION AND SPECIFICATIONS

TT.
INTRODUCTION..........................................................
1-1

1-2.
SPECIFICATIONS.........................................................
1-2

1-3. SAFETY
CONSIDERATIONS................................................
1-4

1-4.	LIST OF
ACCESSORIES....................................................
1-4

Section 2 OPERATING INSTRUCTIONS

IT.
INTRODUCTION..........................................................
2-1

2-2.	UNPACKING YOUR
INSTRUMENT.......................................... 2-1

2-3. GENERAL
OPERATION.................................................... 2-1

2-4. FUSE
REPLACEMENT.....................................................
2-2

2-5. PHYSICAL
FEATURES..................................................... 2-2

2-6. Front
Panel..............................................................
2-2

2-7. Back
Panel...............................................................
2-4

2-8. CRT
Display.............................................................
2-4

2-9.
OPERATION..............................................................
2-5

2-10. INITIAL
SETUP...........................................................
2-6

2-11. Range
Selection...........................................................
2-6

2-12. Channel
Selection.........................................................
2-6

2-13. Frequency
Selection.......................................................
2-8

2-14. Pulse
Generator...........................................................
2-8

2-15. HUNTRON SWITCHER 410
CONNECTIONS................................. 2-10

2-16. TRACKER
TRAINING..................................................... 2-11

2-17. EXTERNAL CLEANING AND
LUBRICATION................................ 2-11

2-18.	STORAGE
INSTRUCTIONS................................................
2-11

Section 3 THEORY OF OPERATION

IT
INTRODUCTION..........................................................
3-1

3-2.	FUNCTIONAL
OVERVIEW................................................. 3-1

3-3. Control
Logic............................................................
3-2

3-4.
Oscillator................................................................
3-3

3-5. Signal
Section............................................................
3-4

3-6. Pulse
Generator...........................................................
3-5

3-7. CRT
Display.............................................................
3-7

3-8. Power
Supply............................................................
3-7

3-9. VOLTAGE AND POWER
CONSIDERATIONS................................. 3-7

3-10. Power in a
Resistor........................................................
3-8

3-11. Power in a
Diode..........................................................
3-9

3-12. Power in a Zener
Diode................................................... 3-10
 4 MAINTENANCE

TT.
INTRODUCTION..........................................................
4-1

4-2.	SERVICE
INFORMATION.................................................. 4-1

4-3.	CMOS HANDLING
PROCEDURES........................................... 4-1

4-4.	DISASSEMBLY
PROCEDURE............................................... 4-2

4-5.	REASSEMBLY
PROCEDURE............................................... 4-9

4-6.	PERFORMANCE
TESTS................................................... 4-11

4-7.	INTERNAL
ADJUSTMENTS............................................... 4-14

4-8.
TROUBLESHOOTING.....................................................
4-18

Section 5 LIST OF REPLACEABLE PARTS

TT
INTRODUCTION..........................................................
5-1

5-2.	HOW TO OBTAIN
PARTS.................................................. 5-1

Section 6 SCHEMATIC DIAGRAMS

■£T
SCHEMATICS............................................................
6-1

Section 7 RESISTORS, CAPACITORS AND INDUCTORS

TT. TESTING
RESISTORS......................................................
7-1

7-2. Low
Range..............................................................
7-1

7-3. Medium 1
Range..........................................................
7-1

7-4. Medium 2
Range..........................................................
7-2

7-5. High
Range..............................................................
7-3

7-6. TESTING
CAPACITORS....................................................
7-3

7-7. TESTING
INDUCTORS.....................................................
7-5

7-8. TESTING FERRITE
INDUCTORS............................................ 7-7
Section 8 TESTING DIODES

&T THE SEMICONDUCTOR DIODE AND ITS
CHARACTERISTICS................. 8-1

8-2. Diode Symbol and
Definition................................................ 8-1

8-3. The Volt-Ampere
Characteristic.............................................. 8-2

8-4. SILICON
DIODES.........................................................
8-2

8-5. Signatures of a Good
Diode................................................. 8-2

8-6. Signatures of Defective
Diodes.............................................. 8-3

8-7. Signatures of a High Voltage
Diode........................................... 8-7

8-8. RECTIFIER
BRIDGES...................................................... 8-8

8-9. LIGHT EMITTING
DIODES................................................ 8-10

8-10. ZENER
DIODES..........................................................
8-10
9T BIPOLAR JUNCTION
TRANSISTORS........................................ 9-1

9-2. An Important Note About Testing
Transistors................................... 9-2

9-3. NPN BIPOLAR
TRANSISTORS.............................................. 9-2

9-4. B-E
Junction.............................................................
9-3

9-5. C-B
Junction.............................................................
9-3

9-6. C-E
Connection...........................................................
9-3

9-7. PNP BIPOLAR
TRANSISTORS.............................................. 9-5

9-8. B-E
Junction.............................................................
9-5

9-9. C-B
Junction.............................................................
9-6

9-10. C-E
Connection...........................................................
9-7

9-11. POWER TRANSISTORS-NPN AND
PNP..................................... 9-8

9-12. DARLINGTON
TRANSISTORS.............................................. 9-8

9-13. Comparing B-E
Junctions................................................... 9-9

9-14. Comparing C-E
Connections............................................... 9-11

9-15. Comparing C-B
Junctions.................................................. 9-13

9-16. JUNCTION FIELD EFFECT
TRANSISTORS.................................. 9-13

9-17. Gate-Source
Connection................................................... 9-14

9-18. Drain-Gate Connection.............................
...................... 9-15

9-19. Drain-Source
Connection..................................................
9-16

9-20. MOS FIELD EFFECT
TRANSISTORS........................................ 9-16

9-21. MOSFET WITH PROTECTION
DIODE....................................... 9-17

9-22. Gate-Source
Connection................................................... 9-18

9-23. Drain-Gate
Connection....................................................
9-19

9-24. Drain-Source
Connection..................................................
9-20

9-25.	MOSFET WITHOUT A PROTECTION
DIODE................................. 9-21

Section 10 USING THE PULSE GENERATOR

10-1.
INTRODUCTION.........................................................
10-1

10-2. SILICON CONTROLLED RECTIFIERS (SCR)..................
.............. 10-1

10-3. TRIAC
DEVICES.........................................................
10-5

10-4.
TRANSISTORS...........................................................
10-7

10-5.
OPTOCOUPLERS........................................................
10-10

10-6. Transistor
Optocoupler...................................................
10-11

10-7. Darlington Transistor
Optocoupler.......................................... 10-15

10-8. SCR
Optocoupler.......................................................
10-19

10-9. Triac
Optocoupler.......................................................
10-23

10-10. Photocell
Optocoupler....................................................
10-26
11 TESTING MULTIPLE COMPONENT CIRCUITS
11-1. 2000 DIAGNOSTIC
PRINCIPLES............................................ 11-1

11-2. DIODE/RESISTOR
CIRCUITS.............................................. 11-1

11-3. Diode In Parallel With A
Resistor........................................... 11-1

11-4. Diode In Series With A
Resistor............................................. 11-4

11-5. DIODE AND CAPACITOR PARALLEL
COMBINATION....................... 11-6

11-6. RESISTOR AND CAPACITOR PARALLEL
COMBINATION................... 11-10

11-7. INDUCTOR AND DIODE PARALLEL
COMBINATION....................... 11-11

Section 12 TESTING INTEGRATED CIRCUITS
12-1.
INTRODUCTION.........................................................
12-1

12-2. Integrated Circuit
Technology.............................................. 12-1

12-3. Integrated Circuit Testing
Techniques........................................ 12-2

12-4. LINEAR OPERATIONAL
AMPLIFIERS...................................... 12-3

12-5. LINEAR VOLTAGE REGULATORS...................
..................... 12-8

12-6. The 7805
Regulator.......................................................
12-8

12-7. The 7905
Regulator......................................................
12-11

12-8. 555
TIMERS............................................................
12-14

12-9. TTL DIGITAL INTEGRATED
CIRCUITS.................................... 12-20

12-10.
General...............................................................
12-20

12-11. TTL Devices With Totem Pole
Output...................................... 12-21

12-12. LS TTL
Devices........................................................
12-24

12-13. Tri-State LS TTL
Devices................................................. 12-25

12-14. CMOS INTEGRATED
CIRCUITS........................................... 12-28

12-15. Quad NAND
Gate.......................................................
12-29

12-16. Analog
Switch..........................................................
12-30

12-17. MOS STATIC
RAM...................................................... 12-33

12-18.
EPROM................................................................
12-36

12-19. BIPOLAR
PROM........................................................
12-40

12-20. DIGITAL TO ANALOG
CONVERTER...................................... 12-43

12-21.
MICROPROCESSORS....................................................
12-47

Section 13 TESTING COMPONENTS BY COMPARISON
13-1.
INTRODUCTION..................................................................................................................13-1

13-2. SETUP
PROCEDURES........................................................................................................13-1

13-3. POWER TRANSISTORS
MJE240........................................................................................13-2

13-4. MJE240 B-E
Junction..........................................................................................................13-2

13-5. MJE240 C-E
Connection....................................................................................................13-4

13-6. HIGH VOLTAGE DIODE
HV15F........................................................................................13-6

13-7. 100nF 25V ELECTROLYTIC
CAPACITOR......................................................................13-7
 14 SOLVING BUS PROBLEMS
14-1.
INTRODUCTION..................................................................................................................14-1

14-2.	STUCK WIRED-OR
BUS......................................................................................................14-1

14-3.	UNSTUCK WIRED-OR
BUS................................................................................................14-1

14-4.
MEMORIES............................................................................................................................14-1

Section 15 TROUBLESHOOTING TIPS

15-1.	TIPS ON USING YOUR 2000
............................................... 15-1

Appendices

Appendix A HUNTRON TRACKER CMOS
TEST.......................................A-l

Appendix B HUNTRON TRACKER TTL AND CMOS
TESTS.............................B-l
Huntron-9023-Manual-Page-1-Picture


Comments (0)

No comments yet. Be the first!

Add Comment

* Required information
1000
Captcha Image
Powered by Commentics